April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
EP01.08.02
Quantitative Analysis of the Density of Trap States in Organic Semiconductors
Quantitative Analysis of the Density of Trap States in Organic Semiconductors
by Current-Voltage Measurements on Low-Voltage Thin-Film Transistors
When and Where
Apr 24, 2019
5:00pm - 7:00pm
5:00pm - 7:00pm
PCC North, 300 Level, Exhibit Hall C-E
Presenter(s)
Co-Author(s)
Michael Geiger1,Lukas Schwarz1,Ute Zschieschang1,Dirk Manske1,Jens Pflaum2,Jürgen Weis1,Hagen Klauk1,Thomas Weitz3
Max Planck Institute for Solid State Research1,Julius-Maximilians-Universität Würzburg2,Ludwig-Maximilians-Universität München3
Keywords
electrical properties | organic
Symposium Organizers
Elizabeth von Hauff, Vrije Universiteit Amsterdam
Enrique Gomez, The Pennsylvania State University
Jun-Ichi Hanna, Tokyo Institute of Technology
Peer Kirsch, Merck KGaA
Symposium Support
College of Engineering, Penn State
Session Chairs
Enrique Gomez
Jun-Ichi Hanna
Elizabeth von Hauff