April 22 - 26, 2019
Phoenix, Arizona
2019 MRS Spring Meeting
CP04.04.14

Analysis of Deep Level and Oxide Interface Defects Using 100V HF Schottky Diodes and MOS CV’s for Silicon and 4H SiC HV MOSFETs, Advanced Power Electronics and RF ASIC

When and Where

Apr 23, 2019
5:00pm - 7:00pm
PCC North, 300 Level, Exhibit Hall C-E

Presenter(s)

Co-Author(s)

James Pan1

Northrop Grumman Electronic Systems1

Keywords

deep level transient spectroscopy (DLTS) | metal

Symposium Organizers

Timothy Rupert, University of California, Irvine
Fadi Abdeljawad, Clemson University
Julie Cairney, The University of Sydney
Jason Trelewicz, Stony Brook University

Session Chairs

Fadi Abdeljawad
Julie Cairney
Timothy Rupert
Jason Trelewicz

In this Session