December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
EN14.05.21

Defect Formation Mechanism in Thermoelectric SnSe Structure Employing Atomic-Resolution Transmission Electron Microscope

When and Where

Dec 2, 2019
8:00pm - 10:00pm
Hynes, Level 1, Hall B

Presenter(s)

Co-Author(s)

YongKyu Lee1,2,Sung-Pyo Cho3,2,In Chung1,2

Institute for Basic Science1,Seoul National University2,National Center for Inter-University Research Facilities, Seoul National University3

Keywords

defects | transmission electron microscopy (TEM)

Symposium Organizers

Jayakanth Ravichandran, University of Southern California
Sabah Bux, California Institute of Technology
Anubhav Jain, Lawrence Berkeley National Laboratory
Alexandra Zevalkink, Michigan State University

Session Chairs

Sabah Bux
Anubhav Jain
Jayakanth Ravichandran
Alexandra Zevalkink

In this Session