X-Ray Reflectivity with a Twist—Quantitative Time Resolved X-Ray Reflectivity Using Monochromatic Synchrotron Radiation

Dec 3, 2019
11:00am - 11:15am

Hynes, Level 2, Room 209

Howie Joress

Joel Brock

Arthur Woll

Howie Joress^1,2,Shane Arlington³,Timothy Weihs³,Joel Brock²,Arthur Woll²

National Institute of Standards and Technology¹,Cornell University²,Johns Hopkins University³

in situ | x-ray reflectivity

Ashwin Shahani, University of Michigan

Guillaume Reinhart, Institut Matériaux Microélectronique Nanosciences de Provence

Damien Tourret, IMDEA

Amy Clarke, Colorado School of Mines

Gold
Carl Zeiss Microscopy GmbH

Bronze
Protochips Inc.

Joseph McKeown

Damien Tourret