December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT05.02.08
Beam Exit Cross-Sectional Polishing (BEXP) and Functional SPM—New Approach for 3D Mapping of Physical Properties of Nanostructures
When and Where
Dec 2, 2019
4:30pm - 4:45pm
4:30pm - 4:45pm
Hynes, Level 2, Room 204
Presenter(s)
Co-Author(s)
Marta Mucientes1,Leonardo Forcieri1,Pamela Jurczak2,Mingchu Tang2,Huiyun Liu2,Yipin Gong3,Tao Wang3,Samuel Jarvis1,Kunal Lulla1,Oleg Kolosov1
Lancaster University1,University College London2,The University of Sheffield3
Keywords
electrical properties | focused ion beam (FIB) | III-V
Symposium Organizers
Frances Allen, University of California, Berkeley
Alex Belianinov, Oak Ridge National Laboratory
Silke Christiansen, Helmholtz Zentrum Berlin für Materialien und Energie
Shane Cybart, University of California, Riverside
Symposium Support
Gold
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Session Chairs
Frances Allen
Alex Belianinov
Shane Cybart