December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT05.02.06
Focused Ion Beam Preparation of Strain Microscopy Samples for Coherent X-Ray Imaging of 3D Nano-Scale Structure and Lattice Strain
When and Where
Dec 2, 2019
4:00pm - 4:15pm
4:00pm - 4:15pm
Hynes, Level 2, Room 204
Presenter(s)
Co-Author(s)
Felix Hofmann1,Nicholas Phillips1,Gareth Hughes1,James Douglas1,Ross Harder2,Wenjun Liu2
University of Oxford1,Argonne National Laboratory2
Keywords
defects | ion-beam processing | x-ray diffraction (XRD)
Symposium Organizers
Frances Allen, University of California, Berkeley
Alex Belianinov, Oak Ridge National Laboratory
Silke Christiansen, Helmholtz Zentrum Berlin für Materialien und Energie
Shane Cybart, University of California, Riverside
Symposium Support
Gold
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Session Chairs
Frances Allen
Alex Belianinov
Shane Cybart