December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT02.13.07

High-Throughput Electron Microscopic Analysis of Nanomaterials Based on Machine Learning Techniques

When and Where

Dec 6, 2019
11:00am - 11:15am
Hynes, Level 2, Room 210

Presenter(s)

Co-Author(s)

Byoungsang Lee1,Seokyoung Yoon2,Jung Heon Lee1,2

Sungkyunkwan University1,SKKU Advanced Institute of Nanotechnology (SAINT)2

Keywords

Au | transmission electron microscopy (TEM)

Symposium Organizers

Jason Hattrick-Simpers, National Institute of Standards and Technology
Barnabas Poczos, Carnegie Mellon University
Markus Reiher, ETH Zurich
Aleksandra Vojvodic, University of Pennsylvania

Symposium Support

Bronze
Machine Learning: Science and Technology | IOP Publishing
Matter & Patterns | Cell Press

Session Chairs

Jason Hattrick-Simpers
Olga Wodo

In this Session