December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT05.05.03
In-Situ Correlative Analysis of Ion-Beam Treated Nanostructures by Combination of AFM and FIB
When and Where
Dec 3, 2019
4:30pm - 4:45pm
4:30pm - 4:45pm
Hynes, Level 2, Room 204
Presenter(s)
Co-Author(s)
Christian Schwalb1,Stefan Hummel1,Robert Winkler2,Jurgen Sattelkow2,Pinar Frank1,Gregor Hlawacek3,Peter Hosemann4,Georg Fantner5,Harald Plank2
GETec Microscopy1,Technical University Graz2,Helmholtz-Zentrum Dresden-Rossendorf3,University of California, Berkeley4,EPFL5
Keywords
in situ | scanning probe microscopy (SPM)
Symposium Organizers
Frances Allen, University of California, Berkeley
Alex Belianinov, Oak Ridge National Laboratory
Silke Christiansen, Helmholtz Zentrum Berlin für Materialien und Energie
Shane Cybart, University of California, Riverside
Symposium Support
Gold
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Session Chairs
Frances Allen
Silke Christiansen