December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT05.02.03
Comparison of Gallium and Neon Ion Beam Milling on GaAs
When and Where
Dec 2, 2019
2:30pm - 2:45pm
2:30pm - 2:45pm
Hynes, Level 2, Room 204
Presenter(s)
Co-Author(s)
Deying Xia1,John Notte1,Ying-Bing Jiang2,Brett Lewis1
Carl Zeiss1,The University of New Mexico2
Keywords
field ion microscopy | focused ion beam (FIB) | ion-beam processing
Symposium Organizers
Frances Allen, University of California, Berkeley
Alex Belianinov, Oak Ridge National Laboratory
Silke Christiansen, Helmholtz Zentrum Berlin für Materialien und Energie
Shane Cybart, University of California, Riverside
Symposium Support
Gold
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Session Chairs
Frances Allen
Alex Belianinov
Shane Cybart