December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MT05.07.01
FIB-SIMS—Recent Advances in Secondary Ion Mass Spectrometry for Analytical Dual Beam Focussed Ion Beam Instruments
When and Where
Dec 4, 2019
10:30am - 11:00am
10:30am - 11:00am
Hynes, Level 2, Room 204
Presenter(s)
Co-Author(s)
Johann Michler1,Lex Pillatsch1,Agnieszka Priebe1
Empa–Swiss Federal Laboratories for Materials Science and Technology1
Keywords
scanning electron microscopy (SEM) | secondary ion mass spectroscopy (SIMS)
Symposium Organizers
Frances Allen, University of California, Berkeley
Alex Belianinov, Oak Ridge National Laboratory
Silke Christiansen, Helmholtz Zentrum Berlin für Materialien und Energie
Shane Cybart, University of California, Riverside
Symposium Support
Gold
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Raith America, Inc.
Silver
ZEISS
Bronze
Kleindiek Nanotechnik GmbH
ORSAY PHYSICS
Ted Pella, Inc.
Session Chairs
Alex Belianinov
Silke Christiansen