December 1 - 6, 2019
Boston, Massachusetts
2019 MRS Fall Meeting
MQ02.08.06
Characterization and Impact of Atomic Imperfections in Si:P Materials and Devices
When and Where
Dec 6, 2019
10:15am - 10:30am
10:15am - 10:30am
Hynes, Level 2, Room 202
Presenter(s)
Co-Author(s)
Scott Schmucker1,Evan Anderson1,Joseph Lucero1,Ezra Bussmann1,Ping Lu1,Aaron Katzenmeyer1,Ting Luk1,Thomas Beechem1,Lisa Tracy1,Tzu-Ming Lu1,Albert Grine1,Daniel Ward1,DeAnna Campbell1,Phillip Gamache1,Mark Gunter1,Shashank Misra1
Sandia National Laboratories1
Keywords
crystal growth | scanning probe microscopy (SPM)
Symposium Organizers
Hanhee Paik, IBM T J Watson Research Center
Dohun Kim, Seoul National University
Tracy Northup, Universtität Innsbruck
Ben Palmer, Laboratory for Physical Sciences
Symposium Support
Platinum
IBM Q, IBM Research
The Kavli Foundation
Bronze
Quantum Science and Technology | IOP Publishing
IBM Q, IBM Research
The Kavli Foundation
Bronze
Quantum Science and Technology | IOP Publishing
Session Chairs
Vivekananda Parampalli Adiga
David Pappas