Giuseppina Polino1,Angela Langella1,Valentina Mollo1,Aldo Di Carlo2,Francesca Brunetti2,Paolo Netti1,Francesca Santoro1
Istituto Italiano di Tecnologia1,Università di Roma Tor Vergata2
Keywords
electrical properties
| photoconductivity
| scanning electron microscopy (SEM)
Symposium Organizers
Liang Guo, The Ohio State University
Bin Liu, National University of Singapore
Ivan Minev, Technische Universität Dresden
Mikhail G Shapiro, California Institute of Technology
Symposium Support
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.