Peter De Wolf1,Zhuangqun Huang1,Bede Pittenger1,Mickael Febvre1,Denis Mariolle2,Nicolas Chevalier2
Bruker Nano Surfaces1,CEA-Leti2
Keywords
electrical properties
| in situ
| scanning probe microscopy (SPM)
Symposium Organizers
Laurene Tetard, University of Central Florida
Oleg Kolosov, Lancaster University
Fabian Menges, University of Colorado Boulder
Michael Molinari, Universite de Reims Champagne Ardenne
Symposium Support
SPECS-TII, Inc.
MRS Invitation to Publish All authors are invited to submit articles based on their 2018 MRS Spring Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.