April 2 - 6, 2018
Phoenix, Arizona
2018 MRS Spring Meeting
CM03.02.06
X-Ray Diffraction with In Situ Electrical Nanoprobe Characterization—Correlating the Electrical Properties of Nanostructures with Their Strain and Defects Distribution
When and Where
Apr 3, 2018
4:15pm - 4:30pm
4:15pm - 4:30pm
PCC North, 100 Level, Room 129 B
Presenter(s)
Co-Author(s)
Zhe Ren1,Jovana Colvin1,Thomas Cornelius2,Stephane Labat2,Danial Bahrami3,Ali Al Hassan3,Olivier Thomas2,Ulrich Pietsch3,Anders Mikkelsen1,Rainer Timm1
Lund University1,Aix Marseille University2,University of Siegen3
Keywords
in situ | scanning tunneling microscopy (STM) | x-ray diffraction (XRD)
Symposium Organizers
Olivier Thomas, Aix Marseille Université
Ross Harder, Argonne National Laboratory
Hyunjung Kim, Sogang University
Ulrich Pietsch, University of Siegen
Symposium Support
DECTRIS Ltd.
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
Session Chairs
Ross Harder
Ulrich Pietsch