California Institute of Technology1,Institute of High Performance Computing2,The University of Tennessee3
Keywords
dislocations
| grain boundaries
| transmission electron microscopy (TEM)
Symposium Organizers
Robert Maass, University of Illinois at Urbana-Champaign
Peter Derlet, Paul Scherrer Institute
Michael Falk, Johns Hopkins University
Christopher Woodward, Air Force Research Laboratory
Symposium Support
Bruker Nano Surfaces
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.