April 2 - 6, 2018
Phoenix, Arizona
2018 MRS Spring Meeting
CM03.02.01
Defects and Interdiffusion in Semiconductor Nanowires Revealed by In Situ Coherent Diffraction Imaging
When and Where
Apr 3, 2018
1:30pm - 2:00pm
1:30pm - 2:00pm
PCC North, 100 Level, Room 129 B
Presenter(s)
Co-Author(s)
Stephane Labat1,Marie-Ingrid Richard2,1,Sara Fernandez1,2,Maxime Dupraz3,Marc Verdier3,Guillaume Beutier3,Marc Gailhanou1,Jérôme Carnis1,Pascal Gentile4,Joel Eymery4,Tobias Schulli2,Olivier Thomas1
CNRS- Aix-Marseille Université1,ID01-ESRF2,CNRS-Univ Grenoble Alpes3,CEA4
Keywords
interface | nanoscale | x-ray diffraction (XRD)
Symposium Organizers
Olivier Thomas, Aix Marseille Université
Ross Harder, Argonne National Laboratory
Hyunjung Kim, Sogang University
Ulrich Pietsch, University of Siegen
Symposium Support
DECTRIS Ltd.
MRS Invitation to Publish
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
All authors are invited to submit articles based on their 2018 MRS Spring
Meeting presentations to journals in the MRS portfolio.
(www.mrs.org/publications-news) Papers submitted and accepted for
publication in MRS Advances (www.mrs.org/mrs-advances) will be
available as symposium collections. Visit the MRS/Cambridge University
Press Publications Booth #100 in the Exhibit Hall to learn more, including
MRS Advances print options available at special rates during the meeting
week only.
Session Chairs
Ross Harder
Ulrich Pietsch