November 25 - 30, 2017
Boston, Massachusetts
2017 MRS Fall Meeting
NM04.12.41

Ultimate Contact Scaling for MoS2 Transistors Using Edge Contacts

When and Where

Nov 30, 2017
8:00pm - 10:00pm
Hynes, Level 1, Hall B

Presenter(s)

Co-Author(s)

Zhihui Cheng1,Steven Noyce1,Katherine Price1,Aaron Franklin1

Duke University1

Keywords

ion-beam processing | scanning transmission electron microscopy (STEM)

Symposium Organizers

Swastik Kar, Northeastern University
Cinzia Casiraghi, University of Manchester
Arindam Ghosh, Indian Institute of Science
Saikat Talapatra, Southern Illinois University

Symposium Support

Nano Futures | IOP Publishing
National Science Foundation
MRS Invitation to Publish All authors are invited to submit articles based on their 2017 MRS Fall Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.

Session Chairs

Annalisa Calo
Mircea Cotlet
Zhong Lin

In this Session