November 25 - 30, 2017
Boston, Massachusetts
2017 MRS Fall Meeting
EM06.10.03
Technique for Super-Resolution Imaging and Individual Readout of Solid-State Defect Centers
When and Where
Nov 29, 2017
9:00am - 9:15am
9:00am - 9:15am
Hynes, Level 1, Room 108
Presenter(s)
Co-Author(s)
Eric Bersin1,Michael Walsh1,Sara Mouradian1,Matthew Trusheim1,Tim Schroeder1,2,Dirk Englund1
Massachusetts Institute of Technology1,University of Copenhagen2
Keywords
metrology | optical properties | spectroscopy
Symposium Organizers
Philippe Bergonzo, CEA Saclay
Timothy Grotjohn, Michigan State University
Mutsuko Hatano, Tokyo Institute of Technology
Christoph Nebel, Fraunhofer IAF
Symposium Support
Applied Diamond, Inc.
Arios Ltd.
CARAT Systems
CIVIDEC Instrumentation GmbH
Cline Innovations, LLC
DiamFab
ICDAT LTD.
Microwave Enterprises, Ltd.
Fraunhofer Center for Coatings and Diamond Technologies- Michigan State University
New Diamond Technology, LLC
Seki Diamond Systems
Arios Ltd.
CARAT Systems
CIVIDEC Instrumentation GmbH
Cline Innovations, LLC
DiamFab
ICDAT LTD.
Microwave Enterprises, Ltd.
Fraunhofer Center for Coatings and Diamond Technologies- Michigan State University
New Diamond Technology, LLC
Seki Diamond Systems
MRS Invitation to Publish
All authors are invited to submit articles based on their 2017 MRS Fall Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.
Session Chairs
Milos Nesladek