November 25 - 30, 2017
Boston, Massachusetts
2017 MRS Fall Meeting
NM08.04.08

Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films

When and Where

Nov 28, 2017
11:45am - 12:00pm
Hynes, Level 3, Room 309

Presenter(s)

Co-Author(s)

Omur Dagdeviren1,Subhasish Mandal1,Ke Zou1,Chao Zhou1,Georg Simon1,Stephen Albright1,M.D. Morales-Acosta1,Xiaodong Zhu1,Sohrab Ismail-Beigi1,Fred Walker1,Charles Ahn1,Udo Schwarz1,Eric Altman1

Yale Univ1

Keywords

microstructure | scanning transmission electron microscopy (STEM) | thin film

Symposium Organizers

Apparao Rao, Clemson University
Paola Ayala, University of Vienna
Yang-Yaun Chen, Academia Sinica
Nai-Chang Yeh, California Institute of Technology

Symposium Support

MRS Invitation to Publish All authors are invited to submit articles based on their 2017 MRS Fall Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.

Session Chairs

Jani Kotakoski
Nai-Chang Yeh

In this Session