Michael Stanford1,Pushpa Pudasaini1,Anna Hoffman1,Philip Rack1
Univ of Tennessee1
Keywords
electrical properties
| ion-beam processing
Symposium Organizers
Alex Belianinov, Oak Ridge National Laboratory
Frances Allen, University of California, Berkeley
Shinichi Ogawa, National Institute of Advanced Industrial Science and Technology
Tom Wirtz, Luxembourg Institute of Science and Technology (LIST)
Symposium Support
Raith America, Inc. ZEISS Microscopy
MRS Invitation to Publish
All authors are invited to submit articles based on their 2017 MRS Fall Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.