November 25 - 30, 2017
Boston, Massachusetts
2017 MRS Fall Meeting
EM01.10.30
Hole Mobility Measurement of P-Type Organic Semiconductors by MIS-CELIV Technique
When and Where
Nov 30, 2017
8:00pm - 10:00pm
8:00pm - 10:00pm
Hynes, Level 1, Hall B
Presenter(s)
Co-Author(s)
Chiho Katagiri1,2,Matthew White3,Cigdem Yumusak4,Niyazi Serdar Sariciftci4,Tsukasa Yoshida1,Ken-ichi Nakayama1,2
Yamagata University1,Osaka University2,The University of Vermont3,Johannes Kepler Universität Linz4
Keywords
electrical properties
Symposium Organizers
Ingo Salzmann, The University of Tokyo, Humboldt-Universität zu Berlin
Jean-Luc Bredas, Georgia Institute of Technology
Seth Marder, Georgia Institute of Technology
Christian Muller, Chalmers University of Technology
Thuc-Quyen Nguyen, University of California, Santa Barbara
Symposium Support
1-Material Inc.
Applied Materials, Inc.
Chemistry of Materials | ACS Publications
Guangzhou ChinaRay Optoelectronic Materials Co. Ltd.
MilliporeSigma (Sigma-Aldrich Materials Science)
Applied Materials, Inc.
Chemistry of Materials | ACS Publications
Guangzhou ChinaRay Optoelectronic Materials Co. Ltd.
MilliporeSigma (Sigma-Aldrich Materials Science)
MRS Invitation to Publish
All authors are invited to submit articles based on their 2017 MRS Fall Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.