Variations in Electric Switching and Transverse Resistance of GeTe/ Sb₂Te₃ Superlattices at Elevated Temperature Studied by Conductive Scanning Probe Microscopy

When and Where

Nov 30, 2017
2:45pm - 3:00pm

Hynes, Level 1, Room 111

Presenter(s)

Leonid Bolotov

Yuta Saito

Tetsuya Tada

Junji Tominaga

Co-Author(s)

Leonid Bolotov^1,2,Yuta Saito^1,2,Tetsuya Tada^1,2,Junji Tominaga^1,2

National Institute of Advanced Industrial Science and Technology¹,Japan Science and Technology Agency²

Keywords

electrical properties | phase transformation | scanning probe microscopy (SPM)

Symposium Organizers

Christopher Richardson, University of Maryland

Jeffrey McCallum, University of Melbourne

Javad Shabani, The City College of New York

Clare Yu, University of California, Irvine

Symposium Support

Google Inc.
IBM Corp.
Microsoft

Quantum Science and Technology | IOP Publishing

MRS Invitation to Publish All authors are invited to submit articles based on their 2017 MRS Fall Meeting presentations to journals in the MRS portfolio. (www.mrs.org/publications-news) Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as symposium collections. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more, including MRS Advances print options available at special rates during the meeting week only.

Session Chairs

Guido Burkard

2017 MRS Fall Meeting

Variations in Electric Switching and Transverse Resistance of GeTe/ Sb2Te3 Superlattices at Elevated Temperature Studied by Conductive Scanning Probe Microscopy