Common-Gate Measurement System of Solution-Gate Field-Effect Transistor for pH Sensing

When and Where

Dec 1, 2016
2:30pm - 2:45pm

Hynes, Level 3, Room 311

Presenter(s)

Keisuke Igarashi

Takuro Naramura

Shaili Falina Mohd Sukri

Shuhei Abe

Masafumi Inaba

Shintani Yukihiro

Atsushi Hiraiwa

Hiroshi Kawarada

Co-Author(s)

Keisuke Igarashi¹,Takuro Naramura¹,Shaili Falina Mohd Sukri¹,Shuhei Abe¹,Masafumi Inaba¹,Shintani Yukihiro^1,2,Atsushi Hiraiwa¹,Hiroshi Kawarada^1,3

Waseda University¹,Yokogawa Electric. Corp²,The Kagami Memorial Laboratory for Materials Science and Technology³

Keywords

diamond

Symposium Organizers

Paul May, Bristol University

Philippe Bergonzo, CEA Saclay

Timothy Grotjohn, Michigan State University

Mutsuko Hatano, Tokyo Institute of Technology

Symposium Support

Applied Diamond, Arios Ltd. Carat Systems, Cividec Instrumentation GmbH, Cline Innovations, Fine Abrasive Taiwan Fraunhofer USA Inc., Center for Coatings and Diamond Technologies, Microwave Enterprises, LTD, New Diamond Technology, Plassys-Bestek, Seki Diamond

All journals in the MRS portfolio welcome submissions based on the individual presentations at the 2016 MRS Fall Meeting. Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as collections of the symposia. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more about MRS Advances, including print options available at special rates during the meeting week only.

Session Chairs

Anke Krueger

2016 MRS Fall Meeting