Andrew Allen1,Fan Zhang1,Lyle Levine1,Jan Ilavsky2
National Institute of Standards and Technology1,Argonne National Laboratory2
Keywords
alloy
| annealing
| x-ray diffraction (XRD)
Symposium Organizers
Rainer Hebert, University of Connecticut
Mustafa Mehahed, ESI
Austin Poucher, Pratt & Whitney
Richard Ricker, National Institute of Standards and Technology
Symposium Support
SpringerMaterials
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