November 26 - December 1, 2016
Boston, Massachusetts
2016 MRS Fall Meeting
NM1.21.05

Direct Measurements of Surface Fermi Level Pinning in Composition-Tuned InGaAs Nanowires

When and Where

Dec 2, 2016
2:45pm - 3:00pm
Sheraton, 2nd Floor, Liberty ABC

Presenter(s)

Co-Author(s)

Thomas Stettner2,Julian Treu1,Max Speckbacher1,Thomas Whittles2,Wojciech Linhart2,Xiaomo Xu1,Stefanie Morkotter1,Gerhard Abstreiter1,Jonathan Finley1,Timothy Veal2,Gregor Koblmueller1

Technical University of Munich1,University of Liverpool2

Keywords

molecular beam epitaxy (MBE) | x-ray photoelectron spectroscopy (XPS)

Symposium Organizers

Chennupati Jagadish, Australian National Univ
James Cahoon, University of North Carolina at Chapel Hill
Hannah Joyce, University of Cambridge
Qihua Xiong, Nanyang Technological Univ

Symposium Support

JC Nabity Lithography Systems, Lake Shore Cryotronics, Inc., MilliporeSigma (Sigma-Aldrich Materials Science), Nano| A Nature Research Solution, SpringerMaterials
All journals in the MRS portfolio welcome submissions based on the individual presentations at the 2016 MRS Fall Meeting. Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as collections of the symposia. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more about MRS Advances, including print options available at special rates during the meeting week only.

Session Chairs

Ilaria Zardo

In this Session