November 26 - December 1, 2016
Boston, Massachusetts
2016 MRS Fall Meeting
TC4.1.01

Model-Based ADF STEM—From Images towards Precise Atomic Structures in Two and Three Dimensions

When and Where

Nov 28, 2016
9:00am - 9:30am
Hynes, Level 3, Room 300

Presenter(s)

Co-Author(s)

Sandra Van Aert1,Karel Van den Bos1,Annelies De Wael1,Marcos Alania1,Annick De Backer1,Lewys Jones2,Gerardo Martinez1,2,Sara Bals1,Peter Nellist2

University of Antwerp1,University of Oxford2

Keywords

scanning transmission electron microscopy (STEM)

Symposium Organizers

Stephen Pennycook, National University of Singapore
Nigel Browning, Pacific Northwest National Laboratory
Jacek Jasinski, University of Louisville
Joerg Jinschek, FEI Company

Symposium Support

Advanced Structural and Chemical Imaging| SpringerMaterials, FEI, part of Thermo Fisher Scientific, Gatan JEOL, Nion Company
All journals in the MRS portfolio welcome submissions based on the individual presentations at the 2016 MRS Fall Meeting. Papers submitted and accepted for publication in MRS Advances (www.mrs.org/mrs-advances) will be available as collections of the symposia. Visit the MRS/Cambridge University Press Publications Booth #100 in the Exhibit Hall to learn more about MRS Advances, including print options available at special rates during the meeting week only.

Session Chairs

Stephen Pennycook

In this Session