November 27 - December 4, 2020
November 27 - December 4, 2020 (Virtual)
2020 MRS Spring/Fall Meeting

Symposium F.MT01-Advanced In Situ Characterization of Materials Kinetics

In situ (S)TEM and synchrotron X-ray techniques with improved probes and advanced detectors provide unprecedented opportunities to satisfy the emerging research needs in materials science. Materials science has inspired great efforts to advance the integrated platforms to complementarily analyze the transformation of materials ranging from materials growth to materials degradation to emergent phenomena. Both in situ (S)TEM and synchrotron X-ray techniques (e.g., imaging, scattering, and spectroscopy) have been employed to study the structural and chemical evolution of functional materials in real time and in operating environments with spatial resolution down to the atomic scale. Correlative information obtained from such in situ techniques has enabled new insights into materials transformation mechanisms. The big data generated from such multimodal characterization methods has inspired significant efforts to model and simulate the transformations, which has accelerated the discovery and development of new materials and processes.

The symposium will cover a wide range of topics related to in situ studies of materials. In addition, the emerging development and application of in situ techniques will be focused on the study of phase transitions, materials growth, energy transfer, structural and chemical evolution in operando. The goal of this symposium is to bring together scientists and engineers from across multiple disciplines to share their successes and initiate new collaborations for in situ characterizations and modeling/simulations.


Topics will include:

  • In situ imaging of phase transition (temperature, pressure, environmental)
  • Real-time of materials growth
  • Real-time probing materials in catalysis swings
  • Behavior of energy materials
  • Mechanically, electrically or magnetically driven processes of functional materials
  • Self-assembly
  • Big data in in situ characterizations
  • Defects in materials (function and characterization)
  • Electron beam/x-ray interaction with materials
  • Novel in situ techniques
  • In situ methods with theoretical modeling

Invited Speakers:

  • Ilke Arslan (Argonne National Laboratory, USA)
  • Artur Braun (Empa–Swiss Federal Laboratories for Materials Science and Technology, Switzerland)
  • Qian Chen (University of Illinois at Urbana-Champaign, USA)
  • Miaofang Chi (Oak Ridge National Laboratory, USA)
  • James De Yoreo (Pacific Northwest National Laboratory, USA)
  • Hongyou Fan (Sandia National Laboratories, USA)
  • Eva Olsson (Chalmers University of Technology, Sweden)
  • Xiaoqing Pan (University of California, Irvine, USA)
  • Amanda Petford-Long (Argonne National Laboratory, USA)
  • Frances Ross (Massachusetts Institute of Technology, USA)
  • Renu Sharma (National Institute of Standards and Technology, USA)
  • Tao Sun (Argonne National Laboratory, USA)
  • He Tian (Zhejiang University, China)
  • X.J. Wang (SLAC National Accelerator Laboratory, USA)
  • Zhongwu Wang (Cornell University, USA)
  • Xianghui Xiao (Brookhaven National Laboratory, USA)
  • Haimei Zheng (Lawrence Berkeley National Laboratory, USA)

Symposium Organizers

Yugang Sun
Temple University
USA

Yu Han
King Abdullah University of Science and Technology
Saudi Arabia

Michael Behr
Dow
USA

Yuzi Liu
Argonne National Laboratory
USA

Topics

in situ nanoscale nucleation & growth phase transformation scanning transmission electron microscopy (STEM) transmission electron microscopy (TEM) x-ray diffraction (XRD)