Co-sponsored by the IEEE Electron Devices Society and the Materials Research Society, the 77th Device Research Conference (DRC) brought together leading scientists, researchers and students to share their latest discoveries in device science, technology and modeling. High-caliber technical sessions were accented by plenary talks from international leaders to highlight the transformative results that are shaping the modern world.
Set for Sunday through Tuesday, June 23-25, 2019, the DRC Exhibit offered the most direct access to researchers from around the world who are seeking technical solutions to their challenges.
Micro Probe Station; Vacuum Probe Station; Micro Optical Chamber
Data Acquisition; DMM Touchscreen Multimeters; Source Measure Unit Instruments; Low Level Electrical Measurement Instruments; I-V Characterization Systems; Power Supplies
University of Michigan, Ann Arbor
911 N. University
Ann Arbor, Michigan 48109
Exhibit: League Ballroom, 2nd Floor