2018 MRS Spring Meeting

Call for Papers

Symposium CM06—Frontiers in Functional Imaging in Aberration-Corrected Electron Microscopy

Over the past decade, substantial advances have been achieved in improving the spatial and energy resolution in scanning/transmission electron microscopy (S/TEM). Capabilities that would have been unheard of only a few years ago, such as obtaining atomic structure images with sub-Å resolution and identifying chemical species with single-atom sensitivity have become routine in TEM labs across the world. However, precisely correlating the physical properties of materials with their nanofeatures is still not straightforward. Emerging electron microscopy techniques, including ptychography, differential phase contrast imaging, atomic-resolution tomography and various atomic-resolution in situ microscopy capabilities, provide new opportunities to probe materials’ characteristics in additional dimensions. Not only can atomic structure and chemical species be revealed, the function of critical nanofeatures can now be probed. As many of these novel techniques still need to be further developed, this symposium intends to bring together researchers from different scientific fields discussing the future advances that will be required of microscopy techniques in order to meet the needs of their applications. The primary aim of this symposium is to foster collaborative research efforts between the microscopy community with interdisciplinary materials fields such that new microscopy techniques can be delivered in a timely and applicable manner to accelerate the design and developments of novel functional materials and devices.

This symposium will focus on the development and advancement of new microscopy techniques, with an emphasis on revealing materials’ functionalities by developing, promoting or implementing novel imaging, spectroscopy, diffraction, and in situ techniques in aberration corrected S/TEM. The integration between microscopy, big data analytics, theoretical simulations, and calculations will also be highlighted.

Topics will include:

  • Imaging internal magnetic and electric fields in materials
  • Revealing electronic structures of materials and correlated to their function
  • Instrumentation developments including new detectors, cameras, and in situ stages
  • Simultaneous probing of light and heavy elements
  • Vibrational and valence electron energy loss spectroscopy
  • 3-D structural retrieval through ptychography, tilt-series or through-focus tomography
  • Multi-dimensional microscopy data acquisition and data analysis
  • Dealing with the new Big Data these techniques supply

Invited Speakers:

  • Nigel Browning (University of Liverpool, United Kingdom)
  • Alex Eggeman (University of Cambridge, USA)
  • Joanne Etheridge (Monash University, Australia)
  • Paulo Ferreira (University of Texas at Austin, USA)
  • Scott Findlay (University of Ottawa, Canada)
  • Sarah Haigh (University of Manchester, United Kingdom)
  • Demie Kepaptsoglou (SuperSTEM, United Kingdom)
  • Andy Lupini (Oak Ridge National Laboratory, USA)
  • John Miao (University of California, Los Angeles, USA)
  • Peter Nellist (University of Oxford, United Kingdom)
  • Xiaoqing Pan (University of California, Irvine, USA)
  • Claus Ropers (University of Göttingen, Germany)
  • Marta Rossell (Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland)
  • Zhiwei Shan (Xi'anjiaotong Univ, China)
  • Naoya Shibata (The University of Tokyo, Japan)
  • Eric Stach (Brookhaven National Laboratory, USA)
  • Kaz Suenaga (National Institute of Advanced Industrial Science and Technology, Japan)
  • Jing Tao (Brookhaven National Laboratory, USA)
  • Haimei Zheng (Lawrence Berkeley National Laboratory, USA)
  • Jian-min Zuo (University of Illinois at Urbana-Champaign, USA)

Symposium Organizers

Ryo Ishikawa
University of Tokyo

Robert Klie
University of Illinois at Chicago
312-996-6064, rfklie@uic.edu

Quentin Ramasse
SuperSTEM Laboratory
United Kingdom
44-0-1925-864-907, qmramasse@superstem.org

Keywords for Abstract Submission

Electron Energy Loss Spectroscopy, Electron Microscopy, Functional Imaging