Symposium CM06—Frontiers in Functional Imaging in Aberration-Corrected Electron Microscopy
Over the past decade, substantial advances have been achieved in improving the spatial and energy resolution in scanning/transmission electron microscopy (S/TEM). Capabilities that would have been unheard of only a few years ago, such as obtaining atomic structure images with sub-Å resolution and identifying chemical species with single-atom sensitivity have become routine in TEM labs across the world. However, precisely correlating the physical properties of materials with their nanofeatures is still not straightforward. Emerging electron microscopy techniques, including ptychography, differential phase contrast imaging, atomic-resolution tomography and various atomic-resolution in situ microscopy capabilities, provide new opportunities to probe materials’ characteristics in additional dimensions. Not only can atomic structure and chemical species be revealed, the function of critical nanofeatures can now be probed. As many of these novel techniques still need to be further developed, this symposium intends to bring together researchers from different scientific fields discussing the future advances that will be required of microscopy techniques in order to meet the needs of their applications. The primary aim of this symposium is to foster collaborative research efforts between the microscopy community with interdisciplinary materials fields such that new microscopy techniques can be delivered in a timely and applicable manner to accelerate the design and developments of novel functional materials and devices.
This symposium will focus on the development and advancement of new microscopy techniques, with an emphasis on revealing materials’ functionalities by developing, promoting or implementing novel imaging, spectroscopy, diffraction, and in situ techniques in aberration corrected S/TEM. The integration between microscopy, big data analytics, theoretical simulations, and calculations will also be highlighted.