2018 MRS Spring Meeting

Call for Papers

Symposium CM03—Investigating Nanostructures with X-RaysFundamentals and Applications

The last decade has seen a tremendous evolution of X-ray imaging and microscopy. This has been driven by the rapid development of third and fourth generation X-ray facilities and X-ray optics capable of producing coherent beams routinely below 100 nm in size. The high penetrating power, extreme sensitivity of X-rays to strain and defects and the tunability of these new sources to access X-ray fluorescence of much of the periodic table has enabled in situ or operando studies of nano-scale properties materials. It is worth also emphasizing that small X-ray beams may also be used to induce an electrical current or light emission in the nano-object enabling enhanced scanning probe and photo excitation studies.

Beyond a discussion of the methods which have been developed, and are still an object of active research (coherent diffraction imaging in forward or Bragg conditions, nano X-ray fluorescence imaging, micro-Laue diffraction …), this symposium aims to disseminate knowledge of these new tools to a broader community of materials scientists.

The range of materials science topics is indeed very large: nanostructures (nanowires, nano-islands) play a role in electronic, and optoelectronic devices, photovoltaic applications, catalysis, energy harvesting and storage, and even structural materials.

In all these areas, being able to investigate local structure-function relationships at the nano-scale during operation is a fundamental issue. The techniques described above have begun to make a major impact on these fundamental materials science questions. Invited speakers, as well as the growing community of X-ray facility users, will present a complete overview of the capabilities and science being engaged with X-ray imaging and microscopy. These capabilities are only going to grow with the new, high brightness, synchrotrons appearing and being planned worldwide.

Topics will include:

  • X-ray Imaging and Microscopy developments:
    • Coherent X-ray diffraction imaging
    • Laue diffraction microscopy
    • X-ray fluorescence microscopy
    • Full field diffraction X-ray microscopy
  • Materials science utilizing the methods:
    • Strain mapping and engineering
    • Nanowires (metals, oxides, semiconductors)
    • Mechanical properties at the nanoscale
    • Optoelectronic properties of nanowires
    • X-ray nanodiffraction
    • Electrical properties of nanowires
    • In situ or operando studies

Invited Speakers:

  • Felisa Berenguer (SOLEIL Synchrotron, France)
  • Xiaojing Huang (Brookhaven National Laboratory, USA)
  • Stéphane Labat (Aix Marseille Université, France)
  • Lyle Levine (National Institute of Standards and Technology, USA)
  • Yoshinori Nishino (Hokkaido University, Japan)
  • Marie-Ingrid Richard (European Synchrotron Radiation Facility, France)
  • Ian Robinson (University College London, United Kingdom)
  • Tobias Schulli (European Synchroton Radiation Facility, France)
  • Hyunjoon Shin (Pohang Light Source II, Republic of Korea)
  • Oleg Shpyrko (University of California, San Diego, USA)
  • Yukio Takahashi (Osaka University/RIKEN, Japan)
  • Nobumichi Tamura (Advanced Light Source, USA)
  • Samuel Tardif (CEA, France)
  • Andrew Ulvestad (Argonne National Laboratory, USA)
  • Jesper Wallentin (Lund University, Sweden)

Symposium Organizers

Olivier Thomas
Aix Marseille Université

Ross Harder
Argonne National Laboratory
X-Ray Science Division
630-252-0852, rharder@aps.anl.gov

Hyunjung Kim
Sogang University
Department of Physics
Republic of Korea
82-2-705-8431, hkim@sogang.ac.kr

Ulrich Pietsch
University of Siegen
Department of Physics

Keywords for Abstract Submission

crystal defects, in situ, Nanowires, operando, strain engineering, strain mapping, X-ray imaging