2018 MRS Spring Meeting

Call for Papers

Symposium CM01—Exploring Nanoscale Physical Properties of Materials via Local Probes

Establishing connections between the structure, physical and chemical traits on materials at the nanoscale is key to engineering devices and systems with enhanced performance. Local probes used in Scanning Probe Microscopy (SPM) play a critical role in accessing such information expanding both sensitivity and scope of probed materials properties. However, many challenges remain to offer tools that will be suitable to explore the fundamental science in complex heterogeneous and dynamically changing systems that are of high interest in tomorrow’s technology world.

The purpose of this symposium is to link the needs of materials scientists with the advanced knowledge of instrumentalists to conceive the next generation of platforms that are vital to foster scientific discoveries. The meeting will be the opportunity for discussions between champions in the field of SPM techniques both in terms of advancing the state of the art in instrumentations and in application of the new tools to advance the fundamental understanding of materials properties in various fields of science.

Topics will include:

  • Static and dynamic physical properties of materials via SPM
  • Nanoscale heat transport and temperature measurements with SPM
  • Quantitative measurements and metrology of physical properties with SPM
  • Nanomechanical mapping and measurements using local probes
  • Subsurface imaging with local nanoscale probes
  • SPM in liquid, electrolytes and aggressive environments
  • Chemical and molecular imaging with SPM
  • Time-resolved and ultrafast measurements with SPM
  • Nanoscale studies of soft matter, biological and biomaterial systems
  • Novel probes for nanoscale subsurface, chemical and time-resolved studies
  • Emerging semiconductor materials with SPM
  • SPM of 2D materials, heterostructures and composites
  • Engineered interfaces with SPM
  • A tutorial complementing this symposium is tentatively planned.

Invited Speakers:

  • David Alsteens (Université Catholique de Louvain, Belgium)
  • Andrea Centrone (National Institute of Standards and Technology, USA)
  • Oscar Custance (National Institute for Materials Science, Tsukuba, Japan)
  • Ulrike Diebold (Vienna University of Technology, Austria)
  • Shadi Fatayer (IBM Zurich Research Laboratory, Switzerland)
  • Ricardo Garcia (Instituto de Ciencia de Materiales de Madrid, Spain)
  • Cristina Giusca (National Physics Laboratory, United Kingdom)
  • Bernd Gotsmann (IBM Zurich Research Laboratory, Switzerland)
  • Peter Grutter (McGill University, Canada)
  • Bryan Huey (University of Connecticut, USA)
  • Samuel Jarvis (Lancaster University, United Kingdom)
  • Stefan Maier (Imperial College London, United Kingdom)
  • Markus Raschke (University of Colorado Boulder, USA)
  • Felix Rico (INSERM Université de Marseille, France)
  • John Sader (University of Melbourne, Australia)
  • Hermann Schillers (University of Munster, Germany)
  • Li Shi (University of Texas, USA)
  • Thomas Thundat (University of Alberta, Canada)
  • Wan-Yu Tsai (Oak Ridge National Laboratory, USA)

Symposium Organizers

Laurene Tetard
University of Central Florida
Nanoscience Technology Center

Oleg Kolosov
Lancaster University
Department of Physics and Materials Science Institute
United Kingdom
44-0-1524-593619, o.kolosov@lancaster.ac.uk

Fabian Menges
University of Colorado Boulder
Department of Physics

Michael Molinari
Université de Reims
Laboratoire de Recherche en Nanosciences (LRN)

Keywords for Abstract Submission

Nanoscale material characterization, Nanoscale Spectroscopy, Scanning Probe Microscopy