Sergei V. Kalinin, Oak Ridge National Laboratory
The Lab on a Beam—Big Data and Artificial Intelligence in Scanning Transmission Electron Microscopy
Atomically resolved imaging of materials has become the mainstay of modern materials science, as enabled by the advent of aberration-corrected scanning transmission electron microscopy (STEM). However, the wealth of quantitative information contained in the fine details of atomic structure or spectra remains largely unexplored. In this talk, I will present the new opportunities enabled by physics-informed big data and machine learning technologies to extract physical information from static and dynamic STEM images, ranging from statistical thermodynamics of alloys to kinetics of solid-state reactions on a single defect level. Synergy of deep learning image analytics and real-time feedback further allows harnessing beam-induced atomic and bond dynamics to enable direct atom-by-atom fabrication. Examples of direct atomic motion over mesoscopic distances, engineered doping at a selected lattice site, and assembly of multiatomic structures will be demonstrated. These advances position STEM toward the transition from a purely imaging tool for atomic-scale laboratory of electronic, phonon and quantum phenomena in atomically engineered structures.
About Sergei V. Kalinin
Sergei V. Kalinin is the Director of the Institute for Functional Imaging of Materials (IFIM) and distinguished staff member at the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory. He received his MS degree from Moscow State University in 1998 and PhD degree from the University of Pennsylvania (with Dawn Bonnell) in 2002.
His research presently focuses on the applications of big data and artificial intelligence methods in atomically resolved imaging by scanning transmission electron microscopy and scanning probes, as well as mesoscopic studies of electromechanical and transport phenomena via scanning probe microscopy.
Kalinin has co-authored >600 publications, with a total citation of >25,000 and an h-index of >77. He is a Fellow of the Materials Research Society (MRS), American Physical Society (APS), Institute of Physics (IoP), Institute of Electrical and Electronics Engineers (IEEE), Foresight Institute, and the American Vacuum Society (AVS); a recipient of the RMS Medal for Scanning Probe Microscopy (2015); Presidential Early Career Award for Scientists and Engineers (PECASE) (2009); Burton Medal of the Microscopy Society of America (2010); 3 R&D100 Awards (2008, 2010, and 2016); and a number of other distinctions.