Innovation in Materials Characterization Award

Innovation in Materials Characterization Award Recipients

• Nikhilesh Chawla, Purdue University (2024)

  "For innovations in developing time-resolved methods to characterize the evolution of microstructural features of materials under complex loading and environmental conditions"
  

• Franz J. Giessibl, University of Regensburg, Germany (2023)

  "For enabling subatomic resolution capability of atomic force microscopy and for the invention of the qPlus sensor, a smart AFM probe with outstanding spatial resolution."

• Annamaria Petrozza, Italian Institute of Technology (2022)

  "For the development and innovative use of time-resolved carrier dynamics measurements, from sub-picoseconds to milliseconds, to fundamentally advance our understanding of the photo-physics of metal-halide perovskites, leading to materials and devices of improved stability"
  
  

• Jianwei (John) Miao, University of California, Los Angeles (2021)

  "For pioneering coherent diffractive imaging for a wide range of material systems and atomic electron tomography for determining atomic positions without assuming crystallinity"
  
  
  

• Jinghua Guo, Lawrence Berkeley National Laboratory (2020)

  "For pioneering in situ/operando soft x-ray spectroscopy characterization of interfacial phenomena in energy, catalysis and chemical materials science"
  
  
  

• Stig Helveg, Haldor Topsoe A/S (2019)

  “For pioneering atomic-scale transmission electron microscopy under reactive gas environments, leading to groundbreaking insights in catalysis, crystal growth and corrosion.”
  
  
  

• David G. Cahill, University of Illinois at Urbana-Champaign (2018)

  “For developing transformative methods for characterizing the thermal transport properties of materials and their interfaces using time-domain thermoreflectance (TDTR) and related approaches”
  
  
  

• Joost W.M. Frenken, Advanced Research Center for Nanolithography (2017)

  “For the development, application and commercialization of high-speed, temperature-controlled, in situ scanning probe microscopy, leading to key insights in the structure, dynamics and chemistry of surfaces and interfaces”
  
  
  

• George M. Pharr, Oak Ridge National Laboratory (2010)

  "For seminal contributions to the development of the instrumentation and analysis methods of nanoindentation for characterizing the mechanical properties of materials at the micrometer- and nanometer-length scales. Their work on nanoindentation has profoundly impacted all fields of materials research where mechanical behavior is important."

  (with Warren C. Oliver)
• Warren C. Oliver, Nanomechanics Inc. (2010)

  "For seminal contributions to the development of the instrumentation and analysis methods of nanoindentation for characterizing the mechanical properties of materials at the micrometer- and nanometer-length scales. Their work on nanoindentation has profoundly impacted all fields of materials research where mechanical behavior is important."

  (with George M. Pharr)
• David J. Larson, Cameca Instruments (2011)

  “For the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements.”
  

  (with Tye T. Gribb and Thomas F. Kelly)
• Thomas F. Kelly, Cameca Instruments (2011)

  “For the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements.”
  

  (with Tye T. Gribb and David J. Larson)
• Tye T. Gribb, DTE Research & Design LLC (2011)

  “For the highly successful conception, design, fabrication, and commercialization of an ergonomic three-dimensional local-electrode atom probe (LEAP) tomograph that enables the determination of the local composition information, on an atom-by-atom basis, of metallic, semiconducting, ceramic and organic materials, on a subnanometer scale, in direct space, with high mass resolving power and signal-to-noise ratio, permitting the determination of small concentrations of all elements."

  (with Thomas F. Kelly and David J. Larson)
• Stephen J. Pennycook, Oak Ridge National Laboratory (2012)

  “For his pioneering use of aberration-corrected Z-contrast scanning transmission electron microscopy in the characterization of materials at the atomic scale."
   
   
  
  
  

• John F. Rabolt, University of Delaware (2013)

  "For the development of Fourier Transform Raman Spectroscopy and the demonstration of its utility for examining the chemical structure and properties of organic molecules and polymers in solids, thin films and solutions." 
  
  (with D. Bruce Chase)

• D. Bruce Chase, University of Delaware (2013)

  "For the development of Fourier Transform Raman Spectroscopy and the demonstration of its utility for examining the chemical structure and properties of organic molecules and polymers in solids, thin films and solutions." 
  
  (with John F. Rabolt)

• Albert Polman, University of Amsterdam, FOM Institute AMOLF (2014)

  "For the development, application and commercialization of Angle-Resolved Cathodoluminescence Imaging Spectroscopy (ARCIS) as a new tool for optical imaging at the nanoscale, with applications in nanophotonics and materials science in general."
   
   

• John M. Carpenter, Argonne National Laboratory (2015)

  "For innovations in neutron sources that have fundamentally changed their performance and enabled opportunities for further advancement of materials that improve the quality of life."
  
   
   
  

• Chongmin Wang, Pacific Northwest National Laboratory (2016)

  "For seminal contributions to the imaging of specimens in liquids using transmission electron microscopy, revolutionizing the direct observation of materials processes, batteries during operation and biological structures."
  
  (with Niels de Jonge and Frances M. Ross)
  

• Frances M. Ross, IBM T.J. Watson Research Center (2016)

  "For seminal contributions to the imaging of specimens in liquids using transmission electron microscopy, revolutionizing the direct observation of materials processes, batteries during operation and biological structures."
  
  (with Niels de Jonge and Chongmin Wang)
  

• Niels de Jonge, INM–Leibniz Institute for New Materials (2016)

  "For seminal contributions to the imaging of specimens in liquids using transmission electron microscopy, revolutionizing the direct observation of materials processes, batteries during operation and biological structures."
  
  (with Frances M. Ross and Chongmin Wang)