Symposium VV: Advanced Materials Exploration with Neutrons and Synchrotron X-Rays
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- November 25-30, 2012
- Boston, Massachusetts
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Meeting Chairs:
Chennupati Jagadish, Thomas Lippert, Amit Misra, Eric Stach, Ting Xu
Modern diffraction methods of synchrotron and neutron radiation, combined simultaneously with time-resolved or imaging techniques, allow a multidimensional insight into materials. Thus, time-resolved and in-situ information from an ensemble of individual grains in a polycrystalline material can be obtained while undergoing mechanical, chemical, or electric load under working, or extreme, conditions. The powerful radiation sources, from reactors to spallation sources, synchrotrons to free-electron lasers, together with advanced detection, data analysis, and modeling tools, revolutionize the insight into materials in a broadest sense.
Contributions are sought in the fields of metallurgy and materials forming; energy materials in realistic conditions; and response of functional materials under parametric load. The methods shall cover time and lengths scales from picoseconds to days, and sub-angstrom to meters, respectively. Particularly, contributions using an innovative approach in their application, or from the novel upcoming facilities with unprecedented possibilities, are solicited.
In-situ processes
- Time-resolved
- Complex environments
- Extreme conditions
Single-grain resolved studies
- Embedded grain characterization
- Grain statistics
- Orientation relationships
- Subgrains
Strain scanning
- Strains and residual stresses
- Multiple length scales
- Grain resolved strain
Texture
- Three-dimensional reciprocal space mapping
- Texture evolution
- Local texture
Liquid, amorphous, nanocrystalline, and distorted materials
- Pair distribution function
- Diffuse scattering
- Phase transformations
- Local structure
Materials imaging/tomography
- Real-time imaging
- High resolution tomography
- Combined diffraction tomography
Exotic and future experimental developments
- Coherent beam diffraction
- Fourier reconstruction
- X-ray photo-correlation spectroscopy
- Ultrafast processes
- Stepping into the future with x-ray-free electron lasers
A joint session relating to diffraction methods applied to amorphous substances is being considered with Symposium NN: Structure-Property Relations in Amorphous Solids.
A tutorial on neutron and synchrotron x-ray diffraction methods is tentatively planned. Further information will be included in the MRS Program that will be available online in September.
Joel D. Brock (Cornell
Univ.),
Donald W. Brown (Los Alamos
National Lab),
John D. Budai (Oak
Ridge National Lab),
Henry Chapman
(Ctr. for Free-Electron Laser Science, Germany),
Daniel Chateigner (Univ. Caen Basse-Normandie, France),
Takeshi Egami (Oak Ridge National Lab),
Vincent Favre-Nicolin (CEA, France),
Jerome Hastings (Linac Coherent
Light Source, SLAC National Accelerator Lab),
Veijo Honkimaki (European Synchrotron Radiation Facility, France),
Andreas Magerl (Univ.
Erlangen-Nürnberg, Germany),
Kazutaka G.
Nakamura (Tokyo Inst. of Technology, Japan),
Keith Nugent (Univ. of Melbourne, Australia),
Henning Poulsen (Technical Univ. of Denmark, Denmark),
David Reis (Stanford Univ.),
Axel Steuwer (European Spallation
Source Scandinavia, Sweden),
Robert M. Suter (Carnegie Mellon
Univ.),
Richard Welberry (Australian
National Univ., Australia).
Klaus-Dieter Liss
Australian Nuclear Science and Technology Organisation
Locked Bag 2001, Kirrawee DC, NSW 2232, Australia
Tel 61-2-9717-9479
Fax 61-2-9717-3606
kdl@ansto.gov.au
Rozaliya Barabash
University of Tennessee/Oak Ridge National Laboratory
Dept. of Materials Science and Engineering
P. O. Box 2008, Oak Ridge, TN 37831-6118
Tel 865-241-7230
Fax 865-574-7659
barabashr@ornl.gov
Ulrich Lienert
Argonne National Laboratory
Advanced Photon Source
431/A007, 9700 S. Cass Ave., Argonne, IL 60439
Tel 630-252-0120
Fax 630-252-5391
lienert@aps.anl.gov
Burkhard Schillinger
Technische Universität München
Research Reactor FRM-II
D-85747 Garching, Germany
Tel 49-89-289-12185
Fax 49-89-289-14997
burkhard.schillinger@frm2.tum.de
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